Title :
Cost competitive PI-SI co-design for DDR interfaces
Author :
Cai, Kinger Xingjian ; Ji, Steven Yun
Author_Institution :
Intel Corporation, Santa Clara, CA, United States
Abstract :
The total DDR on-die AC power delivery noise can be decomposed into high pass filtered (HPF) Vppa and low pass filtered (LPF) Vppb. PI-SI co-simulation reveals that Vppa impacts timing (eye width) and Vppb impacts signal voltage amplitude (eye height), and they need to be budgeted in different manner. Consequently the Power Delivery Network (PDN) is optimized with significant Cpkg and Cdie reduction for a small form factor while maintaining the reliable SI performance, which is demonstrated with a DDR interface and correlated with lab measured data on a particular SoC platform.
Keywords :
Capacitance; Correlation; Noise; Resonant frequency; Silicon; System-on-chip; Timing; Burst-Idle-Burst (BIB); DDR; PI-SI co-simulation; Power Delivery Network (PDN); correlation; small Form Factor;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
DOI :
10.1109/ISEMC.2015.7256239