• DocumentCode
    2211318
  • Title

    Time domain measurement of mode characteristics in coupled microstrip lines

  • Author

    Chao, Fang-Lin

  • Author_Institution
    ERSO/Ind. Technol.Res. Inst., Hsinchu, Taiwan
  • fYear
    1993
  • fDate
    9-13 Aug 1993
  • Firstpage
    226
  • Lastpage
    230
  • Abstract
    The even and odd mode impedances of coupled microstrip lines on a printed circuit board were calculated by a numerical method and measured by time-domain reflectometry (TDR). The capacitance matrix of the coupled lines was calculated by the method of moments. The mode impedances were obtained by utilizing a similar transformation. Measured results were found to be in good agreement with calculated data. The electromagnetic radiation characteristics of coupled lines were also observed in the time domain using a transverse electromagnetic (TEM) cell. The radiated waveform of the even mode was found to be different from that of the odd mode. The timing relationship was clearly demonstrated by the time-domain results, which provide useful information on the transient radiation characteristics of the coupled lines
  • Keywords
    electric impedance; matrix algebra; method of moments; microstrip lines; printed circuits; time-domain reflectometry; TEM cell; capacitance matrix; coupled microstrip lines; electromagnetic radiation characteristics; even mode impedance; method of moments; numerical method; odd mode impedances; printed circuit board; radiated waveform; time domain measurement; time-domain reflectometry; time-domain results; timing relationship; transient radiation characteristics; transverse electromagnetic cell; Coupling circuits; Electromagnetic coupling; Electromagnetic measurements; Electromagnetic radiation; Impedance measurement; Microstrip; Printed circuits; Reflectometry; Time domain analysis; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    0-7803-1304-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1993.473742
  • Filename
    473742