Title :
Susceptibility to EMI of a Battery Management System IC for electric vehicles
Author :
Aiello, Orazio ; Crovetti, Paolo S. ; Fiori, Franco
Author_Institution :
Automotive Business Unit, NXP Semiconductors, Gerstweg 2, 6534 AE Nijmegen, Netherlands
Abstract :
The susceptibility to Electromagnetic Interference (EMI) of Battery Management Systems (BMSs) for Li-ion and LiPo battery packs employed in emerging electric and hybrid electric vehicles is investigated in this paper. To this purpose, a specif c test board is developed to experimentally assess the EMI susceptibility of a BMS front-end integrated circuit by direct power injection (DPI) and radiated susceptibility measurements. Experimental results are discussed highlighting different EMI-induced failure mechanisms observed during the tests.
Keywords :
Batteries; Capacitors; Electromagnetic interference; Hybrid electric vehicles; Integrated circuits; Pins; Radio frequency; Anechoic Chamber; Battery Management System (BMS); Direct Power Injection (DPI); Electric Vehicles (EVs); Hybrid Electric Vehicles (HEVs); IC-level EMC; Li-ion Battery Pack; Susceptibility to Electromagnetic Interference (EMI);
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
DOI :
10.1109/ISEMC.2015.7256257
