• DocumentCode
    2211849
  • Title

    The Use of Statistical Methods to Insure the Quality and Optimization of Polysilicon Deposition

  • Author

    Aceves-Mijares, Mariano ; Murphy-Arteaga, Roberto ; Torres-Jacome, Alfonso ; Calleja-Arriaga, Wilfrido

  • Author_Institution
    Instituto Nacional De Astrofisica, Optica Y Electronica
  • fYear
    1993
  • fDate
    24-27 Oct 1993
  • Firstpage
    105
  • Lastpage
    112
  • Keywords
    Analysis of variance; Chemicals; Extraterrestrial measurements; Fabrication; Optimization methods; Rotation measurement; Statistical analysis; Temperature; Thickness control; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 1993 International
  • Type

    conf

  • DOI
    10.1109/IRWS.1993.666298
  • Filename
    666298