Title :
Frequency characterization of a 2.4 GHz CMOS LNA by thermal measurements
Author :
Mateo, Diego ; Altet, Josep ; Aldrete-Vidrio, Eduardo ; González, José Luis
Author_Institution :
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona
Abstract :
This paper presents a technique to obtain electrical characteristics of analog and RF circuits, based on measuring temperature at the silicon surface close to the circuit under test. Experimental results validate the feasibility of the technique. Simulated results show how this technique can be used to measure the bandwidth and central frequency of a 2.4 GHz low noise amplifier (LNA) designed in a 0.35 microns standard CMOS technology
Keywords :
CMOS integrated circuits; UHF amplifiers; UHF integrated circuits; integrated circuit testing; low noise amplifiers; 0.35 microns; 2.4 GHz; CMOS LNA; RF characterization; electrical characteristics; frequency characterization; low noise amplifier; thermal testing; CMOS technology; Circuit simulation; Circuit testing; Electric variables; Electric variables measurement; Frequency measurement; Noise measurement; Radio frequency; Silicon; Temperature measurement;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-9572-7
DOI :
10.1109/RFIC.2006.1651204
