Title :
Thermal Stability in HVDC Cables: Whether it is Internal or External?
Author :
Reddy, Ch Chakradhar ; Ramu, T.S.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore
Abstract :
The breakdown in HVDC Cable insulation is more often traced to thermal origins. Possibility of two kinds of instability has been suggested in the literature; internal (or intrinsic) thermal instability and external (or interactive) thermal instability. The internal thermal stability is believed to be due to the limitations of thermal and dc resistance of insulation. The interactive thermal stability, on the other hand, is believed to be due to escalation of sheath temperature with voltage under the influence of the thermal resistance of the surroundings. In other words, an interactive instability is caused by an imbalance between heat produced in the insulation and that which is transferred to surroundings from sheath boundary leading to failure of equilibrium (resulting in the escalation or runaway in sheath temperature). Until now, in the literature, the latter type (interactive) received much attention and was almost taken synonymous to the thermal stability. In the present paper the authors investigate for the differences between these two types of thermal failures. Tangible explanations relating to thermal instability in dc cables are presented in the paper.
Keywords :
HVDC power convertors; HVDC power transmission; fault diagnosis; power system stability; HVDC cable insulation; dc resistance; interactive instability; interactive thermal stability; internal thermal stability; sheath temperature; thermal failures; thermal instability; thermal resistance; Breakdown voltage; Cable insulation; Dielectrics and electrical insulation; Electric breakdown; Energy loss; HVDC transmission; Steady-state; Temperature; Thermal resistance; Thermal stability;
Conference_Titel :
Electrical Insulation, 2008. ISEI 2008. Conference Record of the 2008 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-2091-9
Electronic_ISBN :
1089-084X
DOI :
10.1109/ELINSL.2008.4570271