DocumentCode
2212418
Title
Autotune identification via the locus of a perturbed relay system approach
Author
Boiko, Igor
Author_Institution
SNC-Lavalin, Calgary, Alta., Canada
Volume
5
fYear
2003
fDate
4-6 June 2003
Firstpage
4385
Abstract
A methodology of process parameters identification based on the measurement of the locus of a perturbed relay system (LPRS) points from a single or multiple asymmetric rely feedback tests is proposed. An algorithm of identification of the first order plus time delay process model is developed in details. Simple analytical formulas and rules suitable for the use within PID controllers are obtained for this process model.
Keywords
delays; feedback; parameter estimation; relay control; three-term control; PID controllers; autotune identification; locus of perturbed relay system approach; multiple asymmetric relay feedback test; oscillations; single asymmetric relay feedback test; time delay process model; Delay effects; Electrical equipment industry; Feedback; Frequency; Parameter estimation; Relays; Switches; System testing; Three-term control; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2003. Proceedings of the 2003
ISSN
0743-1619
Print_ISBN
0-7803-7896-2
Type
conf
DOI
10.1109/ACC.2003.1240529
Filename
1240529
Link To Document