Title :
Autotune identification via the locus of a perturbed relay system approach
Author_Institution :
SNC-Lavalin, Calgary, Alta., Canada
Abstract :
A methodology of process parameters identification based on the measurement of the locus of a perturbed relay system (LPRS) points from a single or multiple asymmetric rely feedback tests is proposed. An algorithm of identification of the first order plus time delay process model is developed in details. Simple analytical formulas and rules suitable for the use within PID controllers are obtained for this process model.
Keywords :
delays; feedback; parameter estimation; relay control; three-term control; PID controllers; autotune identification; locus of perturbed relay system approach; multiple asymmetric relay feedback test; oscillations; single asymmetric relay feedback test; time delay process model; Delay effects; Electrical equipment industry; Feedback; Frequency; Parameter estimation; Relays; Switches; System testing; Three-term control; Transfer functions;
Conference_Titel :
American Control Conference, 2003. Proceedings of the 2003
Print_ISBN :
0-7803-7896-2
DOI :
10.1109/ACC.2003.1240529
