DocumentCode
2212917
Title
Evaluation of surface roughness standards applying Haralick parameters and Artificial Neural Networks
Author
Alves, Marcelo L. ; Clua, Esteban ; Leta, Fabiana R.
Author_Institution
Inst. Nac. de Metrol. e Qualidade - Inmetro, Rio de Janeiro, Brazil
fYear
2012
fDate
11-13 April 2012
Firstpage
452
Lastpage
455
Abstract
This paper presents a methodology for roughness analysis based on surface characteristics of images obtained from optical and electronic microscopes. Texture analysis has been widely used in different fields, such as medical image analysis, visual interpretation of remote sensing images, image search and industrial quality inspection of manufactured products, which is the focus of this paper. We present a novel method of analysis based on texture characteristics. The Haralick descriptors are used to describe the surface texture and to classify its roughness. The primary roughness standards are evaluated and classified according to several features considering these descriptors. The set of values is the input of a multilayer perceptron artificial neural network. The obtained results show that it can be possible to advance this methodology in order to develop a roughness digital measurement system for the evaluation of surface ending process.
Keywords
image classification; image texture; multilayer perceptrons; surface roughness; Haralick descriptors; Haralick parameters; artificial neural networks; electronic microscopes; image texture analysis; industrial quality inspection; medical image analysis; multilayer perceptron artificial neural network; optical microscopes; remote sensing images; roughness analysis; roughness classification; roughness digital measurement system; surface characteristics; surface ending process; surface roughness standard evaluation; surface texture; Artificial neural networks; Feature extraction; Optical surface waves; Rough surfaces; Surface roughness; Surface treatment; Training; Artificial Neural Network; Haralick descriptors; Roughness; Texture Analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Signals and Image Processing (IWSSIP), 2012 19th International Conference on
Conference_Location
Vienna
ISSN
2157-8672
Print_ISBN
978-1-4577-2191-5
Type
conf
Filename
6208174
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