DocumentCode :
2212917
Title :
Evaluation of surface roughness standards applying Haralick parameters and Artificial Neural Networks
Author :
Alves, Marcelo L. ; Clua, Esteban ; Leta, Fabiana R.
Author_Institution :
Inst. Nac. de Metrol. e Qualidade - Inmetro, Rio de Janeiro, Brazil
fYear :
2012
fDate :
11-13 April 2012
Firstpage :
452
Lastpage :
455
Abstract :
This paper presents a methodology for roughness analysis based on surface characteristics of images obtained from optical and electronic microscopes. Texture analysis has been widely used in different fields, such as medical image analysis, visual interpretation of remote sensing images, image search and industrial quality inspection of manufactured products, which is the focus of this paper. We present a novel method of analysis based on texture characteristics. The Haralick descriptors are used to describe the surface texture and to classify its roughness. The primary roughness standards are evaluated and classified according to several features considering these descriptors. The set of values is the input of a multilayer perceptron artificial neural network. The obtained results show that it can be possible to advance this methodology in order to develop a roughness digital measurement system for the evaluation of surface ending process.
Keywords :
image classification; image texture; multilayer perceptrons; surface roughness; Haralick descriptors; Haralick parameters; artificial neural networks; electronic microscopes; image texture analysis; industrial quality inspection; medical image analysis; multilayer perceptron artificial neural network; optical microscopes; remote sensing images; roughness analysis; roughness classification; roughness digital measurement system; surface characteristics; surface ending process; surface roughness standard evaluation; surface texture; Artificial neural networks; Feature extraction; Optical surface waves; Rough surfaces; Surface roughness; Surface treatment; Training; Artificial Neural Network; Haralick descriptors; Roughness; Texture Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Signals and Image Processing (IWSSIP), 2012 19th International Conference on
Conference_Location :
Vienna
ISSN :
2157-8672
Print_ISBN :
978-1-4577-2191-5
Type :
conf
Filename :
6208174
Link To Document :
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