Image transfer characteristics of europium activated scintillators for medical imaging applications

Author

Cavouras, Dimisis ; Kandarakis, Ioannis ; Theocharakis, Ioannis ; Panayiotakis, George ; Nomicos, Constantine

Author_Institution

Depts. of Med. Instrum. Technol. & Electron., Technological Educ. Inst. of Athens, Greece

Volume

2

fYear

1996

fDate

31 Oct-3 Nov 1996

Firstpage

838

Abstract

Image transfer characteristics (MTF, DQE) of Y₂O₂S:Eu, Y₂O₃:Eu, and YVO₄:Eu image receptors were evaluated. These materials were used in the form of laboratory prepared screens. MTF was experimentally determined by the square wave response method and theoretically evaluated by a diffusion equation model. DQE was calculated using experimentally determined optical data of the scintillators. Light spectra were measured and their compatibility to the spectral sensitivity of various photodetectors was calculated. The MTF and DQE of Y₂O₂S:Eu were better than those of Y₂O₃:Eu, which was superior to YVO₄:Eu. The spectral compatibility of the three scintillators was very good to excellent (0.7 to 0.95), being better than that of some commercially used scintillators

Keywords

X-ray detection; biomedical equipment; biomedical imaging; brightness; europium; fluorescent screens; image intensifiers; optical transfer function; phosphors; photodetectors; scintillation; yttrium compounds; Eu activated scintillators; MTF; Y₂O₂S:Eu; Y₂O₃:Eu; YVO₄:Eu; detective quantum efficiency; diffusion equation model; image receptors; image transfer characteristics; laboratory prepared screens; medical imaging; phosphors; photodetectors; spectral compatibility; spectral sensitivity; square wave response method; Biomedical imaging; Biomedical optical imaging; Charge coupled devices; Educational technology; Optical films; Optical materials; Optical sensors; Photodetectors; Testing; X-rays;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE

Conference_Location

Amsterdam

Print_ISBN

0-7803-3811-1

Type

conf

DOI

10.1109/IEMBS.1996.652000

Filename

652000