Title :
Consistent signal parameter estimation with 1-bit dithered sampling
Author :
Dabeer, Onkar ; Karnik, Aditya
Author_Institution :
Sch. of Technol. & Comput. Sci., Tata Inst. of Fundamental Res., Mumbai, India
Abstract :
We consider the problem of estimating a parameter θ of a signal s(x; θ) corrupted by noise when only 1-bit precision samples are allowed. We propose and analyze a new estimator based on dithered 1-bit samples. Our estimate is consistent and satisfies an asymptotic CLT for a wide class of dither distributions. In particular, uniformly distributed dither leads to only a logarithmic rate loss compared to the case of full precision samples.
Keywords :
parameter estimation; signal processing; 1-bit dithered sampling; asymptotic CLT; dither distributions; signal parameter estimation; Abstracts; Estimation; Sensors;
Conference_Titel :
Signal Processing Conference, 2006 14th European
Conference_Location :
Florence