• DocumentCode
    2213014
  • Title

    Consistent signal parameter estimation with 1-bit dithered sampling

  • Author

    Dabeer, Onkar ; Karnik, Aditya

  • Author_Institution
    Sch. of Technol. & Comput. Sci., Tata Inst. of Fundamental Res., Mumbai, India
  • fYear
    2006
  • fDate
    4-8 Sept. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We consider the problem of estimating a parameter θ of a signal s(x; θ) corrupted by noise when only 1-bit precision samples are allowed. We propose and analyze a new estimator based on dithered 1-bit samples. Our estimate is consistent and satisfies an asymptotic CLT for a wide class of dither distributions. In particular, uniformly distributed dither leads to only a logarithmic rate loss compared to the case of full precision samples.
  • Keywords
    parameter estimation; signal processing; 1-bit dithered sampling; asymptotic CLT; dither distributions; signal parameter estimation; Abstracts; Estimation; Sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Conference, 2006 14th European
  • Conference_Location
    Florence
  • ISSN
    2219-5491
  • Type

    conf

  • Filename
    7071114
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2213014