Thermal stability of perpendicular exchange bias in [Pd/Ferromagnet]N/FeMn films

Author

Joo, H.W. ; Heo, J. ; Choi, H.C. ; Kim, M.S. ; Choi, S.D. ; You, C.-Y. ; Lee, K.A. ; Lee, S.S. ; Hwang, D.G.

Author_Institution

Univ. of Inha, Incheon

Volume

1

fYear

2006

fDate

22-25 Oct. 2006

Firstpage

386

Lastpage

387

Abstract

The dependencies of the annealing temperature and the stack number ,N on perpendicular exchange-biasing(H_ex) and coercivity(H_c) in |Pd/Co|_N and |Pd/Co (or CoFe)l_N/FeMn multilayers were investigated. The surface anisotropy was varied as a function of N with constant bulk anisotropy. It was found that H_ex does not depend on the surface anisotropy, while H_c shows a strong dependence. Therefore, it is possible to tailor wide ranges of the H_c (300 ~ 600 Oe) without varying H_ex(250 ~ 300 Oe) through the single control parameter stack number N. After annealing the H_c shows peak value at 350degC in |Pd/Co] multilayers without FeMn, but the peak temperature is down to 250degC for the exchange biased |Pd/F]_N/FeMn samples.

Keywords

cobalt alloys; coercive force; ferromagnetic materials; iron alloys; magnetic annealing; magnetic multilayers; magnetic thin films; palladium alloys; perpendicular magnetic anisotropy; thermal stability; CoFe; CoFe - Interface; FeMn; FeMn - Interface; Pd-Co; Pd-Co - Interface; Pd/Co multilayers; [Pd/ferromagnet]N/FeMn films; annealing temperature; coercivity; magnetic multilayers; perpendicular exchange bias; surface anisotropy; temperature 350 C; thermal stability; Anisotropic magnetoresistance; Annealing; Coercive force; Magnetic anisotropy; Magnetic multilayers; Perpendicular magnetic recording; Physics; Saturation magnetization; Temperature dependence; Thermal stability; Pd/Co multilayer; coercivity; exchange bias; perpendicular magnetic anisotropy; temperature dependence;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE

Conference_Location

Gyeongju

Print_ISBN

978-1-4244-0541-1

Electronic_ISBN

978-1-4244-0541-1

Type

conf

DOI

10.1109/NMDC.2006.4388779

Filename

4388779