• DocumentCode
    2213074
  • Title

    Junction-level thermal extraction and simulation of 3DICs

  • Author

    Melamed, Samson ; Thorolfsson, Thorlindur ; Srinivasan, A. ; Cheng, Eddie ; Franzon, Paul ; Davis, Rhett

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2009
  • fDate
    28-30 Sept. 2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In 3DICs heat dissipating devices are stacked directly on top of each other leading to a higher heat density than in a comparable 2D chip. 3D integration also moves the majority of active devices further away from the heatsink. This results in a degraded thermal path which makes it more challenging to remove heat from the active devices. Gradient FireBolt was used to perform an appropriate 3D thermal analysis on a 1024-point, memory-on-logic 3DIC FFT processor for synthetic aperture radar (SAR). The chip was simulated with a spatial resolution of 80 nm, and was modeled to include the effect of each line of interconnect, as well as each via and fill structure exactly as drawn in the layout. Large isolated temperature spikes were found near groups of clock buffers at the edge of the SRAMs on the middle tier. It was found that lowering the simulation resolution and using composite thermal conductivities failed to accurately predict the location of these tentpoles.
  • Keywords
    cooling; fast Fourier transforms; heat sinks; synthetic aperture radar; thermal analysis; 3D IC heat dissipating devices; 3D integration; 3D thermal analysis; Gradient FireBolt; SRAM; composite thermal conductivities; heatsink; junction-level thermal extraction; memory-on-logic 3D IC FFT processor; simulation resolution; synthetic aperture radar; Analytical models; Computational modeling; Computer simulation; Design engineering; Heat engines; Resistance heating; Temperature; Thermal conductivity; Thermal degradation; Thermal engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    3D System Integration, 2009. 3DIC 2009. IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-4511-0
  • Electronic_ISBN
    978-1-4244-4512-7
  • Type

    conf

  • DOI
    10.1109/3DIC.2009.5306529
  • Filename
    5306529