• DocumentCode
    2213300
  • Title

    Estimation of Remaining Life of Power Transformers

  • Author

    Pandurangaiah, D. ; Reddy, Ch Chakradhar ; Govindan, T.P. ; Mandlik, Manoj ; Ramu, T.S.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore
  • fYear
    2008
  • fDate
    9-12 June 2008
  • Firstpage
    243
  • Lastpage
    246
  • Abstract
    Inadvertent failure of power transformers has serious consequences on the power system reliability, economics and the revenue accrual. Insulation is the weakest link in the power transformer prompting periodic inspection of the status of insulation at different points in time. A close monitoring of the electrical, chemical and such other properties on insulation as are sensitive to the amount of time-dependent degradation becomes mandatory to judge the status of the equipment. Data-driven diagnostic testing and condition monitoring (DTCM) specific to power transformer is the aspect in focus. Authors develop a Monte Carlo approach for augmenting the rather scanty experimental data normally acquired using Proto-types of power transformers. Also described is a validation procedure for estimating the accuracy of the model so developed.
  • Keywords
    Monte Carlo methods; condition monitoring; failure analysis; fault diagnosis; inspection; insulation testing; life testing; power transformer insulation; power transformer testing; Monte Carlo approach; condition monitoring; data-driven diagnostic testing; periodic inspection; power system economics; power system reliability; power transformer life estimation; revenue accrual; time-dependent degradation; transformer insulation; Chemicals; Condition monitoring; Dielectrics and electrical insulation; Inspection; Life estimation; Power generation economics; Power system economics; Power system reliability; Power transformer insulation; Power transformers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2008. ISEI 2008. Conference Record of the 2008 IEEE International Symposium on
  • Conference_Location
    Vancouver, BC
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4244-2091-9
  • Electronic_ISBN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.2008.4570320
  • Filename
    4570320