Title :
Simple selective electron beam patterning on a single nanowire
Author :
Kim, Kanghyun ; Kang, Haeyong ; Huh, Jung Hwan ; Kim, Gyu Tae
Author_Institution :
Korea Univ., Seoul
Abstract :
Newly developed techniques of selective electron beam patterning on a single nanowire are introduced without using the coordinate markers on the substrate or with the help of the optical microscopes. Coordinate-less patterning by image processing under scanning electron microscope was efficient to define electrodes patterns on the 100 nm scale nanowires. And a method using an optical microscope image made it possible not only to create fine electrodes of 10 nm order of nanowires but to reduce the working times and enable the process easier. A proper selective patterning of the electrode on a selected individual nanowire will be quite helpful for the fundamental researches as the bottom-up approach on the different length scale of nanowires.
Keywords :
electron beam lithography; nanowires; optical microscopy; scanning electron microscopy; coordinate less patterning; optical microscopes; scanning electron microscope; simple selective electron beam patterning; single nanowire; size 100 nm; Carbon nanotubes; Electrodes; Electron beams; Electron optics; FETs; Lithography; Nanoscale devices; Optical microscopy; Optical sensors; Scanning electron microscopy; electron beam lithography; nanodevice; nanowire;
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
Conference_Location :
Gyeongju
Print_ISBN :
978-1-4244-0541-1
Electronic_ISBN :
978-1-4244-0541-1
DOI :
10.1109/NMDC.2006.4388790