• DocumentCode
    2213305
  • Title

    Simple selective electron beam patterning on a single nanowire

  • Author

    Kim, Kanghyun ; Kang, Haeyong ; Huh, Jung Hwan ; Kim, Gyu Tae

  • Author_Institution
    Korea Univ., Seoul
  • Volume
    1
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    408
  • Lastpage
    409
  • Abstract
    Newly developed techniques of selective electron beam patterning on a single nanowire are introduced without using the coordinate markers on the substrate or with the help of the optical microscopes. Coordinate-less patterning by image processing under scanning electron microscope was efficient to define electrodes patterns on the 100 nm scale nanowires. And a method using an optical microscope image made it possible not only to create fine electrodes of 10 nm order of nanowires but to reduce the working times and enable the process easier. A proper selective patterning of the electrode on a selected individual nanowire will be quite helpful for the fundamental researches as the bottom-up approach on the different length scale of nanowires.
  • Keywords
    electron beam lithography; nanowires; optical microscopy; scanning electron microscopy; coordinate less patterning; optical microscopes; scanning electron microscope; simple selective electron beam patterning; single nanowire; size 100 nm; Carbon nanotubes; Electrodes; Electron beams; Electron optics; FETs; Lithography; Nanoscale devices; Optical microscopy; Optical sensors; Scanning electron microscopy; electron beam lithography; nanodevice; nanowire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
  • Conference_Location
    Gyeongju
  • Print_ISBN
    978-1-4244-0541-1
  • Electronic_ISBN
    978-1-4244-0541-1
  • Type

    conf

  • DOI
    10.1109/NMDC.2006.4388790
  • Filename
    4388790