DocumentCode :
2213537
Title :
Time-Domain Pulsed Large-Signal Non-Linear Characterization Of Microwave Transistors
Author :
Charbonniaud, C. ; Teyssier, JP. ; Quéré, R.
Author_Institution :
IRCOM, CNRS UMR 6615, University of Limoges, 19100 Brive, France
fYear :
2003
fDate :
Oct. 2003
Firstpage :
241
Lastpage :
244
Abstract :
Breaking-up the limitations of VNAs for RF non-linear measurements, the LSNA allows time domain characterizations of full two-port active devices. We demonstrate here some capabilities of the LSNA for pulsed RF signals. We establish a stroboscopic mode based on 3 different sampling techniques. This approach is suitable for repetitive pulsed RF signals.
Keywords :
Calibration; Diodes; Frequency conversion; Frequency measurement; Frequency synthesizers; Microwave measurements; Microwave transistors; RF signals; Radio frequency; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2003 33rd European
Conference_Location :
Munich, Germany
Print_ISBN :
1-58053-834-7
Type :
conf
DOI :
10.1109/EUMA.2003.340935
Filename :
4142999
Link To Document :
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