Title :
Characterization and properties of a textured silicon surface with nano-porous layer
Author :
Lee, Eunjoo ; Lee, Soohong
Author_Institution :
Sejong Univ., Seoul
Abstract :
The nano-structural anti-reflection layers were investigated. Nano-porous layer was formed on Si substrates by electrochemical etching in HF-based electrolyte. Porous Si layer on the front surface of n+/p monocrystalline, textured Si substrate have been investigated with the aim of improving the performance of silicon solar cells, because an antireflection coating and a surface passivation can be obtained simultaneously in one process. The nanostructure of porous Si is well aligned with the underlying crystalline Si lattice. The formation of a porous Si layer about 100 nm thick on the textured silicon wafer result in an reflectance lower than 5% in the wavelength region from 500 to 900 nm. Such a surface modification allows improving the Si solar cell characteristics.
Keywords :
antireflection coatings; etching; nanoporous materials; passivation; silicon; solar cells; Si; Si - Element; antireflection coating; electrochemical etching; nanoporous layer; nanostructural anti-reflection layers; solar cells; surface modification; surface passivation; textured silicon surface; Coatings; Crystallization; Etching; Optical films; Optical surface waves; Passivation; Photovoltaic cells; Reflectivity; Silicon; Surface texture; Anti-reflection coating; Nano-porous; Porous silicon; Pyramid; Reflectance; Solar cell;
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
Conference_Location :
Gyeongju
Print_ISBN :
978-1-4244-0541-1
Electronic_ISBN :
978-1-4244-0541-1
DOI :
10.1109/NMDC.2006.4388801