• DocumentCode
    2213764
  • Title

    Thermoelectric properties of Sn-based clathrates

  • Author

    Koga, K. ; Kamei, T. ; Akar, K. ; Oshiro, K. ; Matsuura, M.

  • Author_Institution
    Venture Bus. Lab., Yamaguchi Univ., Ube, Japan
  • fYear
    2005
  • fDate
    19-23 June 2005
  • Firstpage
    222
  • Lastpage
    225
  • Abstract
    Inorganic clathrates consisting in group-IV elements have crystal structures with large cages. Electronic structure and transport properties of Sn-based clathrate semiconductors have been studied by the ab-initio band structure calculating method. In this calculation the FLAPW method with the GGA is used and the Ga configuration of occupied sites is determined by the comparison of the total energy Etot among various configurations. The band gap of the calculated electronic structure Eg is 0.16 eV, which agrees with the experimental result, estimated by the temperature dependence of the electric conductivity. However the band gap Eg=0.16 eV does not explain the experimental Seebeck coefficient α. When we assume a lager band gap Eg=0.45 eV and a carrier concentration ne=8×1018/cm3, the calculated α reasonably explains the experimental data.
  • Keywords
    APW calculations; Seebeck effect; ab initio calculations; carrier density; crystal structure; electrical conductivity; energy gap; semiconductor materials; tin compounds; total energy; FLAPW method; GGA method; Seebeck coefficient; Sn-based clathrate semiconductor; ab-initio band structure calculation; band gap; carrier concentration; crystal structure; electric conductivity; electronic structure; group-IV elements; inorganic clathrates; occupied sites; thermoelectric properties; total energy; transport properties; Conductivity; Crystals; Information technology; Laboratories; Lattices; Phonons; Photonic band gap; Temperature dependence; Thermoelectricity; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2005. ICT 2005. 24th International Conference on
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-9552-2
  • Type

    conf

  • DOI
    10.1109/ICT.2005.1519924
  • Filename
    1519924