DocumentCode :
2214060
Title :
Nonlinear loaded microstrip interconnet analysis with temperature effect
Author :
Ravelo, B.
Author_Institution :
IRSEEM EA 4353 at the Graduate School of Engineering, Av. Galilée, F-76801 Saint Etienne du Rouvray, France
fYear :
2015
fDate :
16-22 Aug. 2015
Firstpage :
1294
Lastpage :
1299
Abstract :
This paper addresses a signal integrity analysis of printed circuit board electrical interconnect with nonlinear capacitance and resistance loads. Based on the global model based on the RLC equivalent circuit of the microstrip line, the routine algorithm of interconnect network is proposed. After numerical computation, it can be found that the nonlinear load can degrade significantly the interconnect responses notably with the occurrence of resonance effects. Based on the measurement of microstrip interconnect printed on FR4-epoxy at the temperature {40°C, 100°C, 140°C}, frequency responses from DC to 3GHz were analyzed. The microstrip interconnect responses were analyzed with transient testing and 0.1Gbps rate bit stream eye diagram. The proposed analysis method can be potentially used for assessing the performance of high density printed circuit board.
Keywords :
Electromagnetic compatibility; Frequency measurement; Integrated circuit interconnections; Microstrip; Resonant frequency; Temperature measurement; Time-domain analysis; PCB electrical interconnect; Signal integrity; nonlinear load; temperature effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
Type :
conf
DOI :
10.1109/ISEMC.2015.7256357
Filename :
7256357
Link To Document :
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