Title :
Preparation and anisotropic thermoelectric properties in misfit cobaltite thin films
Author :
Sakai, Akihiro ; Kanno, Tsutomu ; Yotsuhashi, Satoshi ; Odagawa, Akihiro ; Adachi, Hideaki
Author_Institution :
Adv. Technol. Res. Lab., Matsushita Electr. Ind. Co. Ltd., Kyoto, Japan
Abstract :
We have investigated the control of crystal orientation in misfit layered cobaltite A3Co4O9 (A=Ca, Sr) thin films and succeeded in growing epitaxial films with c-axis orientation perpendicular and parallel to the substrate surface by rf-planar magnetron sputtering. Anisotropic transport properties (parallel to the CoO2 layers (||) and perpendicular to the CoO2 layers (⊥)) were measured using the epitaxial films with c-axis parallel to the film plane. The resistivity for Sr3Co4O9 parallel to the CoO2 layers (ρ||) is about 2.5 mΩ cm at room temperature while that perpendicular to the CoO2 layers (ρ⊥) is about 150 mΩ cm. Sr3Co4O9 has lower parallel and perpendicular resistivity than Ca3Co4O9. As for thermoelectric properties of Sr3Co4O9, Seebeck coefficient parallel to the CoO2 layers (S||) is 90 μV/K and that perpendicular to the CoO2 layers (S⊥) is 30 μV/K at room temperature. The power factor parallel to the CoO2 layers is calculated to be 3×10-4 W/mK2, about two times higher than that for Ca3Co4O9. The anisotropic value of resistivity for Ca3Co4O9 and Sr3Co4O9 is about 40 and 60, respectively, and that of Seebeck Coefficient is similarly about 3.
Keywords :
Seebeck effect; calcium compounds; crystal orientation; electrical resistivity; epitaxial layers; power factor; sputter deposition; strontium compounds; 293 to 298 K; Ca3Co4O9; Seebeck coefficient; Sr3Co4O9; anisotropic thermoelectricity; c-axis orientation; crystal orientation; epitaxial films; misfit layered cobaltite thin films; power factor; resistivity; rf-planar magnetron sputtering; room temperature; Anisotropic magnetoresistance; Conductivity; Magnetic anisotropy; Perpendicular magnetic anisotropy; Sputtering; Strontium; Substrates; Temperature; Thermoelectricity; Transistors;
Conference_Titel :
Thermoelectrics, 2005. ICT 2005. 24th International Conference on
Print_ISBN :
0-7803-9552-2
DOI :
10.1109/ICT.2005.1519942