مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2214227

Title :

Wafer Level Implementation

Author :

Hijab, R.

fYear :

1993

fDate :

24-27 Oct 1993

Firstpage :

188

Lastpage :

188

Keywords :

Control equipment; Human computer interaction; Insurance; Production; Protection; Relays; Reliability engineering; Resists; Semiconductor device reliability; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Integrated Reliability Workshop Final Report, 1993 International

Type :

conf

DOI :

10.1109/IRWS.1993.666308

Filename :

666308

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2214227