Title :
Exploratory synthesis of new heavy main group chalcogenides
Author :
Assoud, Abdeljalil ; Derakhshan, Shahab ; Soheilnia, Navid ; Kleinke, Holger
Author_Institution :
Dept. of Chem., Waterloo Univ., Ont., Canada
Abstract :
We have recently commenced to investigate mixed valent tin chalcogenides as well as polychalcogenides, namely SrSn2Se4, Sr2SnSe5, Ba2SnSe5, and Ba2SnTe5. These materials exhibit (calculated and in part experimentally confirmed) band gaps between 0.2 eV (Ba2SnTe5) and 1.2 eV (Ba2SnSe5). Molecular units are predominant in these materials, namely SnSe44- tetrahedra, Sn3Se108- and Sn3Te108uilding blocks, respectively, as well as Se32- and Te54- units. Three-dimensionally interconnected covalent networks were found in the new quaternaries Ba3Cu2Sn3Se10, BaCu2SnSe4, and BaAg2SnSe4, including the Ba2+ cations in one-dimensional channels. Despite the small band gaps (e.g., 0.2 eV for BaAg2SnSe4), the as-prepared samples exhibit rather small electrical conductivities, but large Seebeck coefficients (above +500 μV/K at 300 K). Our most recently discovered polytellurides Ba3Cu14-δTe12 and Ba2Cu4-δTe5 comprising extended Cu atom substructures appear to have thermoelectric properties superior to the tin chalcogenides.
Keywords :
IV-VI semiconductors; Seebeck effect; barium compounds; copper compounds; electrical conductivity; energy gap; narrow band gap semiconductors; semiconductor growth; silver compounds; strontium compounds; tin compounds; 300 K; Ba2SnSe5; Ba2SnTe5; Ba3Cu2Sn3Se10; BaAg2SnSe4; BaCu2SnSe4; Seebeck coefficients; Sr2SnSe5; SrSn2Se4; band gaps; electrical conductivities; heavy main group chalcogenides; mixed valent tin chalcogenides; polychalcogenides; polytellurides; three-dimensionally interconnected covalent networks; Conductivity; Crystalline materials; Heating; Photonic band gap; Semiconductor materials; Silicon compounds; Strontium; Tellurium; Thermoelectricity; Tin;
Conference_Titel :
Thermoelectrics, 2005. ICT 2005. 24th International Conference on
Print_ISBN :
0-7803-9552-2
DOI :
10.1109/ICT.2005.1519948