Title :
Object-based analysis of WorldView-2 imagery of urban areas
Author :
Rizvi, Imdad Ali ; Mohan, B. Krishna
Author_Institution :
Centre of Studies in Resources Eng., Indian Inst. of Technol. Bombay, Mumbai, India
Abstract :
In recent years, remote sensing has become an increasing data source to support urban planning and management due to availability of very high resolution (VHR) images having resolution of less than 0.5 m. Such images allow extracting of detailed information of various targets of urban areas with the help of object-based image analysis (OBIA) in contrast to traditional pixel-based methods [1]. The aim of the study is to investigate the capabilities and robustness of newly available 8-Band images of WorldView-2 (WV-2) for improving urban mapping capabilities with the help of object-based image analysis framework proposed by Rizvi and Mohan [2]. Within naturally occurring classes or within manmade categories it was found with 4-band Quickbird images that there were misclassification of certain objects like clear water and dense shadow [2]. The availability of better spectral capability of Worldview-2 offers greater discrimination capability along with object-based analysis. Therefore, main focus of this research is how this improved spatial and spectral resolution can contribute to extract urban features from the Worldview-2 image using an object-based analysis framework developed by the authors.
Keywords :
feature extraction; geophysical image processing; image resolution; image segmentation; object recognition; 4-band quickbird image; 8-band image; OBIA; VHR image; WV-2; WorldView-2 imagery; clear water; dense shadow; feature extraction; multispectral imagery; object-based image analysis; pixel-based method; spatial resolution; spectral resolution; urban area; urban management; urban mapping capability; urban planning; very high resolution images; Cloud basis function; Neural network; Object-based image analysis (OBIA); WorldView-2;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2012.6351546