• DocumentCode
    2214292
  • Title

    The reliability of MLCC by the additives associated with the grain size and sintering condition

  • Author

    Kim, Hyun Duk ; Kim, Eung Kwon ; Lee, Tae Yong ; Kim, Bong Suk ; Woo, Byong Chul ; Song, Joon Tae

  • Author_Institution
    Sungkyunkwan Univ., Seoul
  • Volume
    1
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    478
  • Lastpage
    479
  • Abstract
    The reliability of mulitilayer ceramic capacitors (MLCCS) with Ni internal electrodes has been studied from the viewpoint of partial oxygen pressure (Po2) during firing. It is shown that the load-life time of the insulation resistance (IR) was prolonged by firing under low Po2, annealing after firing, and the addition of dopants. It is also shown that the generation of oxygen vacancies led to the degradation of IR. Annealing treatment for the oxidation of the dielectric body accelerates the dielectric aging of MLCC. It is found that the appropriate control of the Po2 during firing can improve the reliability of MLCCs with Ni electrodes to a level as high as that of MLCCs with precious metal electrodes. Thus, we have developed an MLCC with Ni electrodes that features high reliability and a capacitance of 2.2 muF for the X7R characteristic.
  • Keywords
    additives; ageing; annealing; ceramic capacitors; dielectric bodies; sintering; MLCC reliability; X7R characteristics; additives; annealing treatment; dielectric aging; dielectric body accelerate; grain size; insulation resistance; internal electrode; metal electrode; mulitilayer ceramic capacitor; partial oxygen pressure; sintering condition; Annealing; Capacitors; Ceramics; Degradation; Dielectrics and electrical insulation; Electrodes; Firing; Grain size; Immune system; Oxidation; BaTiO3; MLCC; X7R; the reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE
  • Conference_Location
    Gyeongju
  • Print_ISBN
    978-1-4244-0540-4
  • Electronic_ISBN
    978-1-4244-0541-1
  • Type

    conf

  • DOI
    10.1109/NMDC.2006.4388825
  • Filename
    4388825