DocumentCode
2214350
Title
Standard cell interconnect length prediction from structural circuit attributes
Author
Heineken, Hans T. ; Maly, Wojciech
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1996
fDate
5-8 May 1996
Firstpage
167
Lastpage
170
Abstract
A new interconnect model is proposed that predicts the distribution parameters of net lengths. The model takes as input a standard cell netlist and provides as output estimates of the mean and variance offer length on a net by net basis. The model was developed and verified on designs produced with two different place and route algorithms
Keywords
cellular arrays; integrated circuit interconnections; integrated circuit modelling; design; interconnect length; interconnect model; place and route algorithm; standard cell; structural circuit attributes; Algorithm design and analysis; Degradation; Delay; Electronics industry; Feedback circuits; Integrated circuit interconnections; Logic; Pins; Predictive models; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996
Conference_Location
San Diego, CA
Print_ISBN
0-7803-3117-6
Type
conf
DOI
10.1109/CICC.1996.510535
Filename
510535
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