Title :
Standard cell interconnect length prediction from structural circuit attributes
Author :
Heineken, Hans T. ; Maly, Wojciech
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
A new interconnect model is proposed that predicts the distribution parameters of net lengths. The model takes as input a standard cell netlist and provides as output estimates of the mean and variance offer length on a net by net basis. The model was developed and verified on designs produced with two different place and route algorithms
Keywords :
cellular arrays; integrated circuit interconnections; integrated circuit modelling; design; interconnect length; interconnect model; place and route algorithm; standard cell; structural circuit attributes; Algorithm design and analysis; Degradation; Delay; Electronics industry; Feedback circuits; Integrated circuit interconnections; Logic; Pins; Predictive models; Uncertainty;
Conference_Titel :
Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3117-6
DOI :
10.1109/CICC.1996.510535
