Title :
Object recognition results using MSTAR synthetic aperture radar data
Author :
Bhanu, Bir ; Jones, Grinnell, III
Author_Institution :
Center for Res. In Intelligent Syst., California Univ., Riverside, CA, USA
Abstract :
This paper outlines an approach and experimental results for synthetic aperture radar (SAR) object recognition using the MSTAR data. With SAR scattering center locations and magnitudes as features, the invariance of these features is shown with object articulation (e.g., rotation of a tank turret) and with external configuration variants. This scatterer location and magnitude quasi-invariance is used as a basis for development of a SAR recognition system that successfully identifies articulated and non-standard configuration vehicles based on non-articulated, standard recognition models. The forced recognition results and pose accuracy are given. The effect of different confusers on the receiver operating characteristic (ROC) curves are illustrated along with ROC curves for configuration variants, articulations and small changes in depression angle. Results are given that show that integrating the results of multiple recognizers can lead to significantly improved performance over the single best recognizer
Keywords :
image recognition; military radar; object recognition; radar imaging; radar receivers; synthetic aperture radar; MSTAR synthetic aperture radar data; ROC curves; SAR; configuration variants; depression angle; external configuration variants; invariance; magnitude quasi-invariance; nonarticulated standard recognition models; nonstandard configuration vehicles; object articulation; object recognition; performance; receiver operating characteristic curves; scattering center locations; tank turret; Azimuth; Character recognition; Image recognition; Intelligent systems; Object recognition; Radar imaging; Radar scattering; Sensor systems; Synthetic aperture radar; Vehicles;
Conference_Titel :
Computer Vision Beyond the Visible Spectrum: Methods and Applications, 2000. Proceedings. IEEE Workshop on
Conference_Location :
Hilton Head, SC
Print_ISBN :
0-7695-0640-2
DOI :
10.1109/CVBVS.2000.855250