Title :
COGRE: A Configuration Memory Reduced Reconfigurable Logic Cell Architecture for Area Minimization
Author :
Okamoto, Yasuhiro ; Ichinomiya, Yoshihiro ; Amagasaki, Motoki ; Iida, Masahiro ; Sueyoshi, Toshinori
Author_Institution :
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
fDate :
Aug. 31 2010-Sept. 2 2010
Abstract :
Because of the redundancy factors of FPGAs, there is a performance gap between FPGAs and ASICs. In this paper, we propose a small-memory logic cell, COGRE, to minimize the FPGA area. Our approach is to investigate the appearance ratio of the logic functions in a circuit implementation. Moreover, we group the logic functions on the basis of the NPN-equivalence class. The results of our investigation show that only small portions of the NPN-equivalence class can cover large portions of the logic functions used to implement circuits. Further, we found that NPN-equivalence classes with a high appearance ratio can be implemented by using a small number of AND gates, OR gates, and NOT gates. On the basis of this observation, we develop 5-input and 6-inputCOGRE architectures composed of several NAND gates and programmable inverters. The experimental results show that the logic area in 6-COGRE is 46.3% smaller than that in 6-LUT. The logic area of 5-COGRE is 32.6% smaller than that of 5-LUT and 10.0% smaller than that of 4-LUT. Further, the total number of configuration memory bits in 6-COGRE is32.1% smaller than the number of configuration memory bits in 6-LUT.
Keywords :
field programmable gate arrays; logic gates; memory architecture; reconfigurable architectures; redundancy; AND gates; ASIC; COGRE architectures; FPGA; NAND gates; NOT gates; NPN-equivalence class; OR gates; area minimization; configuration memory bits; configuration memory reduced reconfigurable logic cell architecture; logic function; programmable inverters; Logic cell; NPN-equivalence; field-programmable gate array;
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2010 International Conference on
Conference_Location :
Milano
Print_ISBN :
978-1-4244-7842-2
DOI :
10.1109/FPL.2010.68