• DocumentCode
    2214567
  • Title

    Thermal Properties of Composites Filled with Different Fillers

  • Author

    Han, Z. ; Wood, J.W. ; Herman, H. ; Zhang, C. ; Stevens, G.C.

  • Author_Institution
    Siemens Power Generation, Charlotte, NC
  • fYear
    2008
  • fDate
    9-12 June 2008
  • Firstpage
    497
  • Lastpage
    501
  • Abstract
    Electrical insulating polymers usually incorporate inorganic fillers to achieve specific electrical, mechanical, thermal properties and reduce cost. In this exploratory work, we have studied the thermal properties, at 40degC, of epoxy resin composites with different filler such as: boron nitride, alumina, diamond, silicon carbide, and silicon nitride, with particle size ranges from micro to nano. The results show that BN is the best material in enhancing the thermal conductivity of the epoxy composites despite the various fillers having comparable or higher thermal conductivities than BN. Our current model shows that large disparities in mechanical modulus - a metric for interfacial compatibility - can cause thermal contact resistance due to increased phonon scattering resulting from the large mismatch between filler particle and resin matrix.
  • Keywords
    alumina; boron compounds; composite materials; diamond; electric properties; filler metals; polymers; silicon compounds; thermal conductivity; wide band gap semiconductors; Al2O3; BN; SiC; SiN; alumina; boron nitride; diamond; electrical insulating polymers; electrical properties; epoxy resin composites; inorganic fillers; mechanical properties; phonon scattering; silicon carbide; silicon nitride; temperature 40 degC; thermal conductivity; thermal contact resistance; thermal properties; Boron; Costs; Dielectrics and electrical insulation; Epoxy resins; Mechanical factors; Plastic insulation; Polymers; Silicon carbide; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2008. ISEI 2008. Conference Record of the 2008 IEEE International Symposium on
  • Conference_Location
    Vancouver, BC
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4244-2091-9
  • Electronic_ISBN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.2008.4570381
  • Filename
    4570381