DocumentCode :
2214595
Title :
Real-Time Fault Detection and Diagnostics Using FPGA-based Architectures
Author :
Naber, Nathan ; Getz, Thomas ; Kim, Yong ; Petrosky, James
Author_Institution :
Dept. of Electr. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
fYear :
2010
fDate :
Aug. 31 2010-Sept. 2 2010
Firstpage :
346
Lastpage :
351
Abstract :
A new methodology for radiation induced real-time fault detection and diagnosis, utilizing FPGA-based architectures was developed. The methodology includes a full test platform to evaluate a circuit while under radiation and an algorithm to detect and diagnose fault locations within a circuit using Triple Design Triple Modular Redundancy (TDTMR). An analysis of the system was established using a fault injection. Additionally a functional gamma irradiation analysis was performed to assess the effectiveness of the method. The detection and diagnosis algorithm was capable of detecting errors by switching dynamically during the analysis of an FPGA. However, only the injected fault test was able to properly diagnose the location of the fault. The results indicate that FPGA radiation induced fault production is dependent upon radiation dose rate. A fully interchangeable and operational testing platform has been established along with an algorithm that detects and diagnoses errors in real-time.
Keywords :
circuit testing; error detection; fault diagnosis; field programmable gate arrays; gamma-rays; heat radiation; redundancy; FPGA based architecture; error detection; fault diagnostics; fault injection; functional gamma irradiation analysis; interchangeable testing; operational testing; radiation dose rate; real time fault detection; triple design triple modular redundancy; Fault Detection; Real-time diagnostics; Single Event Effects; Total Ionizing Dose; Triple Modular Redundancy; gamma radiation; thermal radiation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2010 International Conference on
Conference_Location :
Milano
ISSN :
1946-1488
Print_ISBN :
978-1-4244-7842-2
Type :
conf
DOI :
10.1109/FPL.2010.75
Filename :
5694274
Link To Document :
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