Title :
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams
Author :
Ghosh, Indradeep ; Fujita, Masahiro
Author_Institution :
Fujitsu Laboratories of America
Keywords :
Algorithm design and analysis; Automatic test pattern generation; Circuit faults; Circuit synthesis; Circuit testing; Logic circuits; Logic testing; Sequential analysis; Sequential circuits; Test pattern generators;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855274
