Title :
BIR Issues: Suppliers and Customers
Author :
Frary, J.M. ; Thomas, Robert W.
Author_Institution :
Storage Technology Corporation
Keywords :
Certification; Continuous improvement; Costs; Defense industry; Documentation; Manufacturing industries; Microelectronics; Particle measurements; Qualifications; Telecommunication network reliability;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
DOI :
10.1109/IRWS.1993.666310