Title :
Improved fault diagnosis in scan-based BIST via superposition
Author :
Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution :
University of California
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Compaction; Computer science; Design engineering; Fault diagnosis; Logic testing; Polynomials; Programmable logic arrays;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855276
