The architecture and test structures of the XC8100 FPGA family

Author

Fawcett, B. ; Goetting, E. ; Schultz, D. ; Parlour, D. ; Frake, S. ; Costello, P. ; Eccles, R. ; Leone, B. ; Marquez, D. ; Stokes, S. ; Palczewski, M. ; Peterson, W. ; Gannon, T. ; Hart, W. ; Look, K. ; Voogel, M. ; West, G. ; Tong, V. ; Chang, A. ; Chung

Author_Institution

Xilinx Inc., San Jose, CA, USA

fYear

1996

fDate

5-8 May 1996

Firstpage

255

Lastpage

258

Abstract

The XC8100 FPGA family is based on a new metal-to-metal antifuse technology and a “sea-of-gates” type architecture. Programmable interconnect elements are stacked vertically between metal layers and above the fine-grained logic cells, resulting in small die sizes and low cost. The basic cell is designed specifically for technology-independent design. Each cell can be configured to implement combinatorial, sequential, or three-state buffering functions. Other architectural features include a flexible set of high-drive buffers, output slew rate controls, and PCI-compatible I/O structures. A patented programming and test structure addresses the problem of providing for 100% post-program verification without test vectors

Keywords

CMOS logic circuits; field programmable gate arrays; integrated circuit testing; logic testing; PCI-compatible I/O structures; SOG architecture; XC8100 FPGA family; combinatorial functions; high-drive buffers; metal-to-metal antifuse technology; output slew rate controls; post-program verification; programmable interconnect elements; sea-of-gates architecture; sequential functions; technology-independent design; test structure; three-state buffering functions; CMOS logic circuits; Circuit testing; Costs; Field programmable gate arrays; Integrated circuit interconnections; Logic programming; Logic testing; Programmable logic arrays; Routing; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996

Conference_Location

San Diego, CA

Print_ISBN

0-7803-3117-6

Type

conf

DOI

10.1109/CICC.1996.510554

Filename

510554