Title :
On diagnosis of pattern-dependent delay faults
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
University of Iowa
Keywords :
Circuit faults; Circuit testing; Cities and towns; Delay effects; Error correction; Fault detection; Fault diagnosis; Permission; Physics computing; Process design;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855277
