DocumentCode
2214812
Title
On diagnosis of pattern-dependent delay faults
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
University of Iowa
fYear
2000
fDate
2000
Firstpage
59
Lastpage
62
Keywords
Circuit faults; Circuit testing; Cities and towns; Delay effects; Error correction; Fault detection; Fault diagnosis; Permission; Physics computing; Process design;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855277
Filename
855277
Link To Document