DocumentCode :
2214877
Title :
Capacitive coupling and quantized feedback applied to conventional CMOS technology
Author :
Gabara, Thaddeus ; Fischer, Wilhlem
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fYear :
1996
fDate :
5-8 May 1996
Firstpage :
281
Lastpage :
284
Abstract :
An on-chip capacitor which is formed under a bonding pad is used to block the DC level of an external input signal. Quantized feedback using a self-triggered decision circuit is used to establish local DC voltage levels in the receiver and eliminate the “zero wander” effect. Measurement of a 0.5 μm CMOS chip has demonstrated that: a BER (Bit Error Rate) test for a 231-1 sequence showed no errors at 600 Mb/s; the circuit detected a low frequency signal of 1 Kb/s indicating that coding is not required; and the input signal can be DC biased anywhere, limited only by the ESD diodes, between VDD and VSS without affecting the final recovered CMOS waveform
Keywords :
CMOS digital integrated circuits; capacitance; circuit feedback; error statistics; integrated circuit technology; 0.5 micron; 600 Mbit/s; BER test; CMOS technology; bit error rate; capacitive coupling; local DC voltage levels; onchip capacitor; quantized feedback; self-triggered decision circuit; Bit error rate; Bonding; Capacitors; Circuit testing; Coupling circuits; Electrostatic discharge; Feedback circuits; Frequency measurement; Semiconductor device measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3117-6
Type :
conf
DOI :
10.1109/CICC.1996.510559
Filename :
510559
Link To Document :
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