Title :
The Role Of Reliability Test Chips (RTCs) For Asic Reliability Assessment
Author_Institution :
Motorola
Keywords :
Application specific integrated circuits; CMOS logic circuits; Circuit testing; Electronics packaging; History; Integrated circuit reliability; Logic design; Silicon; Vehicle dynamics; Vehicles;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
DOI :
10.1109/IRWS.1993.666311
