DocumentCode
2215092
Title
Models for the thermal diode open-circuit voltage
Author
Hagelstein, Peter L. ; Kucherov, Yan
Author_Institution
Res. Laboratory of Electron., MIT, Cambridge, MA, USA
fYear
2005
fDate
19-23 June 2005
Firstpage
472
Lastpage
475
Abstract
We have developed a nonlocal generalization of the Onsager current relation to study the enhancement of the open-circuit voltage observed in InSb thermal diode experiments. Numerical solutions are obtained by brute force. Nonlocal effects produce an apparent enhancement of the thermopower in regions where the doping concentration changes. Models show voltage drops associated with npn barriers similar to experiment below 350 K, but are not as great as experimental results at high temperature near 600 K. This is thought to be due to thermal drops at the barrier not accounted for so far.
Keywords
III-V semiconductors; doping profiles; indium compounds; semiconductor diodes; semiconductor doping; thermoelectric power; InSb; Onsager current relation; doping concentration; open-circuit voltage; thermal diode; thermal drops; thermopower; Cities and towns; Electronic mail; Equations; Laboratories; Predictive models; Scattering; Semiconductor diodes; Thermoelectric devices; Thermoelectricity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2005. ICT 2005. 24th International Conference on
ISSN
1094-2734
Print_ISBN
0-7803-9552-2
Type
conf
DOI
10.1109/ICT.2005.1519985
Filename
1519985
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