Title :
Reliable verification using symbolic simulation with scalar values
Author :
Wilson, Chris ; Dill, David L.
Author_Institution :
Stanford University
Keywords :
Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Costs; Data structures; Emulation; Hardware; Laboratories; System testing;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855290
