• DocumentCode
    2215186
  • Title

    System chip test: how will it impact your design?

  • Author

    Zorian, Yervant ; Marinissen, Erik Jan

  • Author_Institution
    LogicVision, Inc.
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    136
  • Lastpage
    141
  • Keywords
    CMOS technology; Circuit testing; Electronic design automation and methodology; Hardware; Integrated circuit testing; Manufacturing; Printed circuits; Standardization; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2000. Proceedings 2000
  • Print_ISBN
    1-58113-187-9
  • Type

    conf

  • DOI
    10.1109/DAC.2000.855292
  • Filename
    855292
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2215186