Title :
System chip test: how will it impact your design?
Author :
Zorian, Yervant ; Marinissen, Erik Jan
Author_Institution :
LogicVision, Inc.
Keywords :
CMOS technology; Circuit testing; Electronic design automation and methodology; Hardware; Integrated circuit testing; Manufacturing; Printed circuits; Standardization; System testing; System-on-a-chip;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855292
