DocumentCode
2215232
Title
Test challenges for deep sub-micron technologies
Author
Cheng, Kwang Ting ; Dey, Sujit ; Rodgers, Mike ; Roy, Kaushik
Author_Institution
Univ. of California
fYear
2000
fDate
2000
Firstpage
142
Lastpage
149
Keywords
Circuit faults; Circuit testing; Computer aided manufacturing; Costs; Crosstalk; Delay; Design for testability; Microprocessors; Power supplies; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855293
Filename
855293
Link To Document