DocumentCode :
2215232
Title :
Test challenges for deep sub-micron technologies
Author :
Cheng, Kwang Ting ; Dey, Sujit ; Rodgers, Mike ; Roy, Kaushik
Author_Institution :
Univ. of California
fYear :
2000
fDate :
2000
Firstpage :
142
Lastpage :
149
Keywords :
Circuit faults; Circuit testing; Computer aided manufacturing; Costs; Crosstalk; Delay; Design for testability; Microprocessors; Power supplies; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
Type :
conf
DOI :
10.1109/DAC.2000.855293
Filename :
855293
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2215232
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