A new substrate network model and parameter extraction for RF nano-CMOS

Author

Choi, Gil-Bok ; Hong, Seung-Ho ; Kang, Hee-Sung ; Jeong, Yoon-Ha

Author_Institution

Pohang Univ. of Sci. & Technol., Pohang

Volume

1

fYear

2006

fDate

22-25 Oct. 2006

Firstpage

508

Lastpage

509

Abstract

A new substrate network model for RF nano-CMOS and a parameter extraction method are proposed here. The model is composed of two resistances and one capacitance to accurately predict high frequency characteristics of nano-CMOS. The parameters are extracted and optimized both analytically and empirically using Z-parameter and Y-parameter analysis. A comparison between a conventional model and the proposed model shows that the proposed model is better in accuracy than conventional model. The measured and simulated data using the proposed model are in strong agreement up to 40.1 GHz

Keywords

CMOS integrated circuits; nanoelectronics; radiofrequency integrated circuits; RF nanoCMOS; Y-parameter analysis; Z-parameter; parameter extraction; substrate network model; Capacitance; Data mining; Dielectric substrates; Electrical resistance measurement; MOSFET circuits; Parameter extraction; Predictive models; Radio frequency; Roentgenium; Solid modeling; RF modeling; nano-CMOS; substrate model;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE

Conference_Location

Gyeongju

Print_ISBN

978-1-4244-0541-1

Electronic_ISBN

978-1-4244-0541-1

Type

conf

DOI

10.1109/NMDC.2006.4388877

Filename

4388877