DocumentCode
2215626
Title
EM Analysis of Shielding Strategies to reduce Substrate Noise in Silicon based Technology
Author
Bajon, D. ; Wane, S. ; Baudrand, H. ; Gamand, P.
Author_Institution
SUPAERO 10 av. Ed. Belin, 31055 Toulouse-France
fYear
2003
fDate
Oct. 2003
Firstpage
647
Lastpage
650
Abstract
EM Fullwave Analysis intend to become an alternative to the required wide experimental investigations on Substrate Noise Reduction Techniques. From a dedicated home-made full-wave simulator, a comprehensive analysis of Guard Ring and shielding techniques is developed in view to enhance their specific efficiency ; intensive field and current distributions support the analysis and isolation capabilities are discussed.
Keywords
Analytical models; Circuit noise; Circuit simulation; Frequency; Impedance; Noise reduction; Protection; Semiconductor device noise; Silicon; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2003 33rd European
Conference_Location
Munich, Germany
Print_ISBN
1-58053-834-7
Type
conf
DOI
10.1109/EUMA.2003.341036
Filename
4143100
Link To Document