DocumentCode :
2215673
Title :
Static noise analysis for digital integrated circuits in partially-depleted silicon-on-insulator technology
Author :
Shepard, Kenneth L. ; Kim, Dae-Jin
Author_Institution :
Columbia University
fYear :
2000
fDate :
2000
Firstpage :
239
Lastpage :
242
Keywords :
Circuit noise; Digital integrated circuits; Insulation; Integrated circuit noise; Integrated circuit technology; Leakage current; Permission; Physics; Silicon on insulator technology; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
Type :
conf
DOI :
10.1109/DAC.2000.855310
Filename :
855310
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2215673
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