DocumentCode :
2215686
Title :
Dynamic noise analysis in precharge-evaluate circuits
Author :
Somasekhar, Dinesh ; Choi, Seung Hoon ; Roy, Kaushik ; Ye, Yibin ; De, Vivek
Author_Institution :
Purdue University
fYear :
2000
fDate :
2000
Firstpage :
243
Lastpage :
246
Keywords :
Capacitance; Circuit analysis; Circuit noise; Circuit simulation; Coupling circuits; Crosstalk; Logic circuits; Noise level; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
Type :
conf
DOI :
10.1109/DAC.2000.855311
Filename :
855311
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2215686
