Title :
L2RFM-local layout realistic faults mapping scheme for analogue integrated circuits
Author :
Ohletz, Michael J.
Author_Institution :
Inst. fur Theor. Elektrotech., Hannover Univ., Germany
Abstract :
A new fault modelling scheme for analogue ICs called Local Layout Realistic Fault Mapping is introduced. It is aimed at realistic fault assumptions prior to the final layout. Defects are assumed and their electrical failure modes are evaluated. It turned out that some faults at schematic level are unrealistic, new types of fault emerge and the distribution of faults changes. For a CMOS operational amplifier the number of faults dropped from 45 to 27
Keywords :
analogue integrated circuits; circuit analysis computing; failure analysis; fault diagnosis; integrated circuit layout; L2RFM scheme; analogue IC layout; analogue integrated circuits; electrical failure modes; fault distribution; fault modelling scheme; local layout realistic faults mapping scheme; Analog integrated circuits; Circuit faults; Circuit simulation; Failure analysis; Fluctuations; Large-scale systems; Manufacturing; Operational amplifiers; Pins; Testing;
Conference_Titel :
Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3117-6
DOI :
10.1109/CICC.1996.510600
