• DocumentCode
    2216019
  • Title

    L2RFM-local layout realistic faults mapping scheme for analogue integrated circuits

  • Author

    Ohletz, Michael J.

  • Author_Institution
    Inst. fur Theor. Elektrotech., Hannover Univ., Germany
  • fYear
    1996
  • fDate
    5-8 May 1996
  • Firstpage
    475
  • Lastpage
    478
  • Abstract
    A new fault modelling scheme for analogue ICs called Local Layout Realistic Fault Mapping is introduced. It is aimed at realistic fault assumptions prior to the final layout. Defects are assumed and their electrical failure modes are evaluated. It turned out that some faults at schematic level are unrealistic, new types of fault emerge and the distribution of faults changes. For a CMOS operational amplifier the number of faults dropped from 45 to 27
  • Keywords
    analogue integrated circuits; circuit analysis computing; failure analysis; fault diagnosis; integrated circuit layout; L2RFM scheme; analogue IC layout; analogue integrated circuits; electrical failure modes; fault distribution; fault modelling scheme; local layout realistic faults mapping scheme; Analog integrated circuits; Circuit faults; Circuit simulation; Failure analysis; Fluctuations; Large-scale systems; Manufacturing; Operational amplifiers; Pins; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-3117-6
  • Type

    conf

  • DOI
    10.1109/CICC.1996.510600
  • Filename
    510600
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2216019