DocumentCode
2216700
Title
Fabrication of micromachined infrared thermopile detector using novel front etch process
Author
Xu, Zhengyi ; Bin Yiong ; Yuelin Wang
Author_Institution
State Key Lab. of Transducer Technol., Acad. Sinica, Shanghai, China
Volume
2
fYear
2001
fDate
22-25 Oct. 2001
Firstpage
797
Abstract
A novel front etch process is developed to remove bulk silicon and leave a thin membrane as the supporting structure in a thermopile detector. Compared with other bulk micromachining processes, our front etch process has advantages in terms of photolithography, reliability and dehydration operation. Using this technology, an infrared thermopile detector was fabricated.
Keywords
etching; infrared detectors; micromachining; microsensors; semiconductor device reliability; thermopiles; Si; Si3N4-SiO2; dehydration operation; front etch process; micromachined infrared thermopile detector fabrication; photolithography; reliability; thin membrane supporting structure; Anisotropic magnetoresistance; Biomembranes; Costs; Dielectric substrates; Fabrication; Infrared detectors; Lithography; Semiconductor thin films; Silicon; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Print_ISBN
0-7803-6520-8
Type
conf
DOI
10.1109/ICSICT.2001.982015
Filename
982015
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