• DocumentCode
    2216886
  • Title

    Ridge penalized logistic partial least squares for predicting stroke deficit from infarct topography: A proof of concept study

  • Author

    Chen, Jian ; Phan, Thanh G. ; Reutens, D.C.

  • Author_Institution
    Southern Clinical Sch., Monash Univ., Clayton, VIC
  • fYear
    2008
  • fDate
    30-31 May 2008
  • Firstpage
    167
  • Lastpage
    170
  • Abstract
    To date, prediction of potential stroke deficit based on ischemic volumes has resulted in imprecise correlation with neurological outcome. This is due to the fact that information of infarct location is not incorporated into the model. We used a novel method, ridge penalised logistic partial least squares regression (RPL-PLS), to build a predictive model of neurological deficit from voxel involvement. The method identified the covariance between infarct locations and neurological deficits from stroke. It had high accuracy for predicting outcome in different neurological domains following stroke. This study provides proof of the concept that stroke outcome can be predicted from the information present in a MRI brain scan and paves the way for the development of similar models for understanding the neuroanatomy of neurological deficit and determining the outcome of rehabilitation and thrombolysis.
  • Keywords
    biomedical MRI; brain; diseases; least squares approximations; neurophysiology; MRI brain scan; infarct topography; ischemic volumes; neuroanatomy; neurological deficit; neurological outcome; rehabilitation; ridge penalized logistic partial least squares; stroke deficit prediction; thrombolysis; Accuracy; Biomedical engineering; Brain modeling; Information technology; Least squares methods; Linear regression; Logistics; Predictive models; Principal component analysis; Surfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology and Applications in Biomedicine, 2008. ITAB 2008. International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-2254-8
  • Electronic_ISBN
    978-1-4244-2255-5
  • Type

    conf

  • DOI
    10.1109/ITAB.2008.4570535
  • Filename
    4570535