DocumentCode :
2216896
Title :
Wafer Bin Triggering: Containment of Statistically Abnormal Wafers
Author :
Kowalczyk, Peter
Author_Institution :
Delco Electronics Corporation
fYear :
1993
fDate :
24-27 Oct 1993
Firstpage :
220
Lastpage :
223
Keywords :
Aggregates; Condition monitoring; Electronic equipment testing; Failure analysis; Gate leakage; Gaussian distribution; Histograms; Manufacturing; Materials testing; Quality management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
Type :
conf
DOI :
10.1109/IRWS.1993.666319
Filename :
666319
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2216896
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