DocumentCode :
2217153
Title :
A fault model for conducted intentional electromagnetic interferences
Author :
Sauvage, Laurent ; Guilley, Sylvain ; Danger, Jean-Luc ; Homma, Naofumi ; Hayashi, Yu-ichi
Author_Institution :
Inst. Mines-Telecom, Telecom ParisTech, Paris, France
fYear :
2012
fDate :
6-10 Aug. 2012
Firstpage :
788
Lastpage :
793
Abstract :
Experimental setups used in electromagnetic compatibility tests can be used as platforms for fault injections. Faulting an equipment is a mean for a malevolent attacker to extract secret information. Compared to other fault injection setups, those based on EMC tests provide three advantages: non-invasivity, absence of synchronization, and frequency selectivity. This injection technique therefore allows the attacker to perform analysis with little knowledge of the targeted equipment. To assess the potential of this attack, a characterization of its effects is needed. This is the purpose of this paper. More precisely, our contributions are twofold: First of all, we observe that the faults are reproducible. Second, we show that the fault model is compatible with known attacks.
Keywords :
electromagnetic compatibility; electromagnetic interference; fault diagnosis; EMC tests; conducted intentional electromagnetic interferences; electromagnetic compatibility tests; fault injection technique; fault model; frequency selectivity; synchronization; Circuit faults; Electromagnetic compatibility; Encryption; Radio frequency; Standards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
ISSN :
2158-110X
Print_ISBN :
978-1-4673-2061-0
Type :
conf
DOI :
10.1109/ISEMC.2012.6351664
Filename :
6351664
Link To Document :
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