DocumentCode
2217239
Title
Self-test methodology for at-speed test of crosstalk in chip interconnects
Author
Bai, Xiaoliang ; Dey, Sujit ; Rajski, Janusz
Author_Institution
University of California
fYear
2000
fDate
2000
Firstpage
619
Lastpage
624
Keywords
Automatic testing; Built-in self-test; Circuit testing; Crosstalk; Delay; Detectors; Fault detection; Integrated circuit interconnections; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855387
Filename
855387
Link To Document