DocumentCode
2217257
Title
Embedded hardware and software self-testing methodologies for processor cores
Author
Chen, Li ; Dey, Sujit ; Sanchez, Pablo ; Sekar, Krishna ; Chen, Ying
Author_Institution
University of California
fYear
2000
fDate
2000
Firstpage
625
Lastpage
630
Keywords
Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Embedded software; Hardware; Performance evaluation; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855388
Filename
855388
Link To Document