DocumentCode :
2217257
Title :
Embedded hardware and software self-testing methodologies for processor cores
Author :
Chen, Li ; Dey, Sujit ; Sanchez, Pablo ; Sekar, Krishna ; Chen, Ying
Author_Institution :
University of California
fYear :
2000
fDate :
2000
Firstpage :
625
Lastpage :
630
Keywords :
Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Embedded software; Hardware; Performance evaluation; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
Type :
conf
DOI :
10.1109/DAC.2000.855388
Filename :
855388
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2217257
